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VLSI testing

  • 275 Pages
  • 4.18 MB
  • 6785 Downloads
  • English

North-Holland, Sole distributors for the U.S.A. and Canada, Elsevier Science Pub. Co. , Amsterdam, New York, New York, N.Y., U.S.A
Integrated circuits -- Very large scale integration -- Tes
Statementedited by T.W. Williams.
SeriesAdvances in CAD for VLSI ;, v. 5
ContributionsWilliams, T. W., 1943-
Classifications
LC ClassificationsTK7874 .V5666 1986
The Physical Object
Paginationix, 275 p. :
ID Numbers
Open LibraryOL2711634M
ISBN 100444878955
LC Control Number86004410

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The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six : Michael Nicolaidis.

Very large-scale integration (VLSI) is the process of creating an integrated circuit (IC) by combining millions of MOS transistors onto a single chip.

VLSI began in the s when MOS integrated circuit chips were widely adopted, enabling complex semiconductor and telecommunication technologies to be developed.

The microprocessor and memory chips are. This book unites Indian and Malaysian experts in computer science, electrical engineering, intelligent systems, and very large scale integration (VLSI) design.

They review the latest theory, research, and practice in the design of low power VLSI systems, with special emphasis on low power integrated circuit design. However, the greater circuit density of VLSI circuits and systems has made testing more difficult and costly.

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VLSI Design 2 Very-large-scale integration (VLSI) is the process of creating an integrated circuit (IC) by combining thousands of transistors into a single chip. VLSI began in the s when complex semiconductor and communication technologies were being developed.

The. Handbook of VLSI Chip Design and Expert Systems provides information pertinent to the fundamental aspects of expert systems, which provides a knowledge-based approach to problem solving.

This book discusses the use of expert systems in every possible subtask of VLSI chip design as well as in the interrelations between the subtasks. COVID Resources. Reliable information about the coronavirus (COVID) is available from the World Health Organization (current situation, international travel).Numerous and frequently-updated resource results are available from this ’s WebJunction has pulled together information and resources to assist library staff as they consider how to handle.

'The book covers the important aspects of VLSI testing, introduces a significant number of testing methods and strategies and is a valuable book on VLSI testing.' Science & Technology Measurement.

Customer Reviews. Barnes & Noble Press. Publish your book Price: $ Additional Physical Format: Online version: Feugate, Robert J., Introduction to VLSI testing. Englewood Cliffs, N.J.: Prentice Hall, © VLSI Design Notes.

This note explains the following topics: VLSI Design Flow, Transistor-Level CMOS Logic Design, VLSI Fabrication and Experience CMOS, Gate Function and Timing, High-Level Digital Functional Blocks, Visualize CMOS Digital Chip Design.

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Associate Editor (), IEEE Transactions on VLSI Systems Board of Governors (), IEEE Computer Society Editor-in-Chief (), IEEE Design & Test of Computers Founder and Consulting Editor, Frontiers in Electronic Testing Book Series Chairman, Steering Committee, VDAT Symposium and VLSI Design Conference.

Nakamura Y, Clouqueur T, Saluja K and Fujiwara H () Diagnosing at-speed scan BIST circuits using a low speed and low memory tester, IEEE Transactions on Very Large Scale Integration (VLSI) Systems,(), Online publication date: 1-Jul Is the first book to focus on the new roles VLSI is taking for the safe, secure, and dependable design and operation of electronic systems; Contributes to a better understanding of threats against safe and secure systems and how to mitigate them by advanced design and testing of VLSI as core components.

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